Semiconductor Drift Detectors: Applications and New Devices

Recent technological developments and new topology designs have made semiconductor drift detectors ideal devices for high-resolution x-ray spectrometry. In this paper the basic topology of a semiconductor drift detector with on-chip electronics specially designed for x-ray spectrometry is reviewed. These devices have been used for the first time in x-ray and g-ray spectroscopy applications. In particular, the results obtained in non-destructive analyses by using a EDXRF spectrometer based on a Peltier cooled semiconductor drift detector and in photodetection of scintillation light are reported. The working principle and the first experimental results for a novel position-sensitive x-ray detector with spectroscopic capability are presented.